• SIM 1

DIP-APCI-Ionsource for Agilent LC/MS-Systems

The Direct Inlet Probe (DIP) is now available for Agilent LC/MS-systems with APCI ion source:

Behind the new design, the proven technology with an automatically controlled, heated push rod, which is already used successfully for several years for the GC/MS-systems of the Agilent 7000, 5973 and 5975.

The decisive innovation of the DIP-APCI source lies in the temperature programmable push rod tip with which the analysis substance is vaporized in front of the corona needle. In conjunction with the Agilent LC/MS technology also complex samples can be analyzed with the direct-inlet with high selectivity and sensitivity. Without a conversion process of the LC/MS System, the measurements can be switched from DIP-APCI/MS to LC-APCI/MS without any problems.

And in combination with an autosampler for liquid and solid samples, the effectiveness can be increased for fast screenings.

Main fields of application of the DIP APCI are food control, product control of the pharmaceutical and chemical industry and the Metabolom research because also very small sample amounts can be analyzed without thinning. In future, this already commercial ion source also will have the possibility of the ionization  with atmospheric pressure photon ionization (APPI) besides APCI. Further information about the field of application as well as the development of the DIP APCI system is described in the article of Labor Praxis "A new ion source for product control ".

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Tel: +49 (0)208 - 94 10 78-0
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